Non-Contact Probes for On-Wafer Characterization of THz Devices and Integrated Circuits A New Approach for On-wafer Measurements: TeraProbes Inc – provides world’s first non-contact metrology solution for high frequency electronic device and IC testing. Our proprietary test-bed consists of an automated probe station and virtual, contact-less probe tips, enabling -for the first time- automated S-parameter … Continue reading TeraProbes